Electronic component handler and tester

ABSTRACT

A machine to handle integrated circuits is disclosed wherein the circuits slide into slots in a wheel with the leads along side the wheel. Kelvin type contacts engage these leads and connect the integrated circuit to suitable testing circuits. The wheel then rotates a quarter turn to where the circuit is ejected into a storage tube if the testing circuits so indicate. If not the circuit falls out of the wheel during the next quarter turn into a reject bin.

United States Patent Baker et al.

[54] ELECTRONIC COMPONENT HANDLER AND TESTER [72] Inventors: AlexanderBaker, Delran, N..l.; Eugene A.

Vosika, New Brighton, Minn.

[73] Assignee: Integrated Mechanical Systems, Inc., Minneapolis, Minn.

[22] Filed: Apr. 23, 1970 [21] Appl. No.: 31,264

s21 U.S.CL .t .....209/8l,324/62R [5i] mot. ..B07c5/344 [58]FieldoiSeareh ..209/8i,73,74,75;324/62 [56] References Cited UNITEDSTATES PATENTS Wilson ..209/8 1 [is] 3,655,041 [4 1 Apr. 11, 19723,413,553 11/1968 Genuaidi ..209/81X Primary Examiner-Richard A.Schacher Attamey-Stryker and Jacobson [57] ABSTRACT A machine to handleintegrated circuits is disclosed wherein the circuits slide into slotsin a wheel with the leads along side the wheel. Kelvin type contactsengage'these leads and connect the integrated circuit tosuitable-testing circuits. The wheel then rotates a quarter turn towhere the circuit is ejected into a storage tube if the testing circuitsso indicate If not the circuit falls out of the wheel during the nextquarter turn into a reject bin.

- 11 Claims, 9 Drawing Figures PATENTEDAPR n 1912 SHEET 1 UF 4 INVENTORSEUGENE. A. l/OS/KA ALEXANDER BAKER ATTORNEYS A Fig.

INVENTORS EUGENE A. l/OS/KA ALEXANDER BAKER ATTORNEYS FKTENTEDAPRHIBYZ3,655,041

snmaora comma. cmcmmv IZB ,lzm 126 TEST CIRCUITRY t INVENTOR S" EUGENEA. VOS/KA ALEXANDER BAKER BY Y gW ATTORNEYS PATENTEDAPR 11 m2 3, 655,041

SHEET 0F 4 CLOSE --CONTACT SURFACE OPEN CONTACT SURFACE CONTACTCOMPLETED I38 |--CANCEL LAST TEST SORT INFORMATION END TEST-f SORTINVENTORS EUGENE A. VOS/KA ALEXANDER BAKER ATTORNEYS.

BACKGROUND OF THE INVENTION lntegrated circuits are finding increasinguse in electronic devices and applications today requiring automatedequipment to test each integrated circuit to insure its performance.Since the typical integrated circuit is very small with many leadstherefrom a sophisticated machine is required inorder to handle thecircuits with a minimum of manual assistance and at a maximum rate.Prior art machines in this field of technology lack a number ofdesirable features necessary to achieve this end. For example, themachine should be able to accept integrated circuits directly from thepackage in which they are shipped and return them to the package afterthey are tested. The machine should be adaptable to different sizeintegrated circuits with little modification. Furthermore, positiveelectrical connections to the integrated circuits should be afforded andthe test initiated after full contact is established to avoid faultytests and arcing. The circuits should also be handled quickly butdelicately to avoid damaging the expensive components. All of theseadvantages and more are afforded by the present invention.

SUMMARY OF THE INVENTION The type of integrated circuit handled by thepresent inventive device comprises a generally rectangular body withleads positioned in two rows one on each side of the body. This type ofcircuit is usually shipped in quantity in long plastic tubes. Accordingto the present invention a slotted wheel is periodically rotated in avertical plane. The shipping plastic tube is inserted into a feedmanifold above the wheel which directs the integrated circuits, oneeach, into the slots of the wheel. The rectangular body rests in theslot with the leads along side the wheel. In this position multipleKelvin type connectors close about the wheel so as to make twoelectrical connections to each lead. The connectors are pivoted intoplace by means of a suitable cam shaft and cam follower arrangement.Once in place, a light photodiode, which monitors the position of thecam shaft, signals the start of the test. Upon completion of apredetermined test interval the decision as to the quality of theintegrated circuit is made by the test circuitry and stored while thewheel moves a quarter turn. In this new position the circuit ismechanically ejected into a second plastic shipping tube if that was thedecision. If not, the ejector mechanism is blocked and the circuit fallsfrom the wheel into a reject bin after the next quarter turn. Thus, itmay be seen that it is an object of our invention to provide an improvedintegrated circuit handler. It is another object of our invention toprovide a handler which is adaptable to different size circuits, testsonly after the electrical connection is completed, and operates toreceive circuits directly from their shipping tubes. Further objects andadvantages will become apparent from the following description anddrawings.

BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of aportion of a typical shipping tube with a typical integrated circuittherein.

FIG. 2 is an elevational plan view of the front of the machine showingsome of the major components thereof.

FIG. 3 is a top view of the machine of FIG. 2 showing the drivemechanism in greater detail.

FIGS. 4a and 4b show in detail the construction of the contact arm andhow it engages the integrated circuit leads.

FIG. 5 shows the indexing cam and the geneva type movement.

FIG. 6 shows the contact actuating cam.

FIG. 7 shows the ejector actuating cam.

FIG. 8 shows the timing disc which controls the time of testing and thetime of sorting.

DESCRIPTION OF THE PREFERRED EMBODIMENT In FIG. 1 a portion of a typicalplastic shipping tube 10 of the type used in he present invention isshown. A typical integrated circuit 12 with leads 14 is shown in thetube. A number of such circuits are usually shipped inserted end to endin a tube in the position shown. Reference should be had to FIG. 2. Tube10 is inserted into a feed manifold 16 which is long enough to hold asufficient quantity of circuits to keep the handler in operation duringautomatic mode operation while a new full tube 10 is inserted. Theintegrated circuits drop into a slot 18 in a wheel 20. Each slot 18 isdefined by an electrically non-conducting insert 22 and a grooved guideinsert 24. Small adjustment tabs 26 are positioned at the bottom of eachslot 18 to determine the size of integrated circuit which can behandled. In the embodiment of FIG. 2 14 pin circuits are disclosed andtabs 26 are chosen to provide a proper slot length therefor.

After wheel 20 comes into position and a circuit 12 drops into slot 18wheel 20 stops since it is driven through a quarter turn at a time bymeans of a geneva mechanism which will be described later. At this pointin time a pair of contact arms 28 and 30 pivot on a pair of pivot pins32 and 34 so as to bring a set of contact elements 36 against leads 14on integrated circuit 12. FIGS. 4a and 4b show in detail two views ofthe end of contact arm 30. As can be seen, each lead 14 is engaged bytwo separate contact elements 36 to ensure a proper electricalconnection therewith. It may be seen in FIG. 4b that eight contactelements are provided on the contact arm. In the preferred embodimentonly seven of these contact leads are used because of the 14 pincircuits being tested. However, conversion to a 16 pin circuit would beimmediately possible because of the eight contact elements. It may alsobe seen, in FIG. 4a, how insert 24 is grooved to help positionintegrated circuit 12. Each pair of contact elements 36 is connected bysuitable leads such as lead 36 in FIG. 3 to test circuitry 40. Referringagain to FIG. 2, contact arms 28 and 30 are pivoted by the insertion ofa spreading cam 42 which is activated by a lever 44 and a cam follower46 which follows a cam 48. Lever 44 pivots at a mounting point 50 on amounting block 52. Block '52 also has an extension 53 which serves tosupport pivot pins 32 and 34. Simultaneous reference to FIG. 3 will helpin understanding the configuration of many of the recited components.

After a predetermined interval of time for testing, contact arms 28 and30 are allowed to spread under the action of a spring 54 by thewithdrawal of spreading cam 42. Wheel 20 then rotates through a quarterturn so as to line up slot 18 with an exit manifold 56 shown in sectionin FIG. 2. A cam 58 then presents a low spot to a cam follower 60 whichis connected to an ejector restraining arm 62. Arm 62 restrains a springdriven ejector rod 64 by engaging a pin 66 thereon. Arm 62 moves to theleft in FIG. 2 allowing a spring 68 to push a collar 70 and thereforerod 64 to the left. A small tongue 72 at the left end of rod 64 movesthrough slot 18 pushing circuit 12 into exit manifold 56, and intoanother shipping tube 11. Before the integrated circuit can be ejectedinto tube 11 an acceptance signal must be sent from the test circuitryalong a line 74 to a solenoid 76 which retracts a pin 78 from in frontof collar 70. If no acceptance signal is transmitted pin 78 blocks theleftward movement of rod 64 and the integrated circuit 12 remains inslot 18. A pair of guide members 80 and 82 (shown only in FIG. 2) ensurethat the circuits remain in slot 18 during the rotational movements ofwheel 20. However, the rejected integrated circuits fall through a hole83 into a reject bin 84 at the end of the next quarter turn of wheel 20upon clearing the end of guide 82.

In FIG. 3 the driving mechanism is shown. A motor 86 is connected to acam drive shaft 88 by means of a pulley 89, a

belt 90 and a free running pulley 91 which is connected to an motion istransmitted to shaft 99 by a geneva type gear 103 and a driving gear105. The operation of the handler may be automatic and repetitive oreach cycle can be manually generated. In either case each cycle isinitiated by a pair of signals from control circuitry 107 to clutch 93and an electromagnetic brake 109. Brake 109 is normally applied to Yprevent any overtravel of the mechanism. The signals from controlcircuits 107 simultaneously release brake 109 and engage clutch 93 so asto initiate rotation of shaft 88 with pulley 91. As soon as rotationbegins a cam 111 activates a microswitch 113 which takes over tomaintain clutch 93 in engagement and brake 109 disengaged despite thediscontinuance of signals from control circuits 107. After one completerevolution of shaft 88 and cam 111 a low spot on cam 111 againdeactivates microswitch 113 so as to engage brake 109 and disengageclutch 93, thus, stopping shaft 88 at the initial beginning position.

FIG. 5 demonstrates the configuration of cam 111 with a low spot on oneside to deactivate microswitch 113. Cam 111 is cut away in FIG. 5 tobetter show the geneva movement. Shaft 99 is locked in place by the hub104 on gear 105 for most of the revolution of shaft 88. However, duringa portion of the rotation a peg 106 enters the slot in gear 103 androtates it through exactly a quarter turn. An indentation in hub 104adjacent peg 106 permits this rotation. Thus, each complete revolutionof shaft 88 generates exactly one quarter revolution in shaft 99 andwheel 20.

Cam 48 is shown in detail in FIG. 6. It may be seen that during eachrevolution of shaft 88 contact arms 28 and 30 are held in a closedposition for one half of the revolution during which wheel 20 isstationary and open for the other half of the revolution when wheel 20is indexing.

Cam 58 is shown in detail in FIG. 7. Cam 58 incorporates a suddenreduction in radius at a point so as to permit ejector rod 64 to moveduring the interval when wheel 20 is stationary.

Returning to FIG. 3 it may be seen that shaft 88 extends back to atiming disk 120. Two light sources 122 and 124 are mounted in a block126 so as to shine through disc 120 to a pair of photodiodes 128 and130. Photodiodes 128 and 130 are connected to test circuitry 40 so as tosignal thereto the position of shaft 88. Reference to FIG. 8 will showthe two semi-annular holes 134 and 136 in disc 120 which pass light fromthe two sources to the two photodiodes. As indicated in FIG. 8, disc 120is positioned on shaft 88 so that angular position 138 is in front ofdiodes 128 and 130 at the moment contact elements 36 contact the leadsof the integrated circuits. However, not until angular position 140 isreached does light pass through hole angular position 140 is reacheddoes light pass through hole 134 energizing photodiode 130 and signalingtest circuits 40 to begin the test. This brief delay guarantees thatthere is no lead damaging arcing between contact elements 36 and leads14. The testing continues till the end of hole 134 is reached. Hole 136starts just before the end of hole 134 thus activating photodiode 128and signalling test circuitry 40 that an accept or reject decision mustbe made be fore the end of hole 134 is reached. This decision is madeand held as long as light passes through hole 136. Hole 136 is, thus,made long enough to permit the rotation of wheel 20 through a quarterturn so that the integrated circuit may reach the eject position whilethe accept or reject decision is still held by test circuitry 40. If thedecision is for acceptance then a signal is sent to solenoid 76 toretract pin 78 allowing the normal ejection sequence to take place asdiscussed earlier. If the decision is to reject, pin 78 is not retractedand therefore, the circuit is not ejected into manifold 56 and dropsinto reject bin 84 after the next quarter turn.

We claim:

1. An integrated circuit handling and testing machine comprising incombination:

a wheel having a plurality of integrated circuit accepting slots in theperiphery thereof in which at least the portions of the wheel adjacentone side of the slots comprise insulating material, said wheel beingdisposed for rotation in a substantially vertical plane;

feed means positioned generally above said wheel adapted to gravity feedsaid circuits into said slots;

receiving means positioned generally beside and below said wheel;

testing means adapted to connect test circuitry to the leads from saidcircuits, said testing means comprising contact arms which contact theleads of the circuits by pressing the leads against the insulatingmaterial with contact ele ments in said contact arms while the circuitsare in said slots,

selector means operable to eject integrated circuits from said slotsinto one of said receiving means beside the wheel upon receiving anappropriate signal from said testing means; and means for periodicallyrotating said wheel.

2. The apparatus of claim 1 in which said testing means furthercomprises electronic test circuitry connected to the contact elements insaid contact arms, which test circuitry is operable to determine thecondition of said integrated circuit and connected to the selector meansso as to control which receiving means said selector ejects the circuitinto.

3. The apparatus of claim 2, in which said selector means comprises atleast one spring driven member restrained by a first cam following meansthe rotation of the corresponding first cam allowing the spring drivenmember to periodically slide said circuits from said slots into one ofsaid receiving means.

4. The apparatus of claim 3, wherein said contact arms are positioned oneach side of said wheel and pivoted into contact with the leads of thecircuits by the action of a second cam following means, the rotation ofthe corresponding second cam operating to periodically pivot saidcontactarms in coordination with said periodic rotation of the saidwheel. 5 The apparatus of claim 4 wherein said first and second cams arecarried by a cam drive shaft which shaft is connected to a motor bymeans of electrically activated clutch means and wherein said means forperiodically rotating the wheel comprises a geneva movement between saidwheel and said cam drive shaft.

6. The apparatus of claim 5 in which said test circuitry controls saidspring driven member by activating a blocking pin whichpin, uponactivation, is retracted so as not to restrain movement of said springdriven member.

- 7. The apparatus of claim 6 including a disk on said cam drive shaft,a pair of light sources adapted to shine through said disk, and a pairof light detectors adapted to receive light when passed by the disc,said detectors connected to said test circuitry, said disc having apattern of light transmitting portions arranged to pass light to saiddetectors and thereby signal to the test circuitry the position of saidcam drive shaft and therefore the appropriate times at which to beginand end the test and activate the selector means.

8. The apparatus of claim 7 including guide members adjacent theperiphery of said wheel so as to prevent said circuits from leaving saidslots at locations other than those corresponding to said feed means andsaid receiving means.

9. The apparatus of claim 8 in which said receiving means comprises anaccept and a reject portion said accept portion receiving circuits slidfrom said slots by said spring driven member and said reject portioncomprising a receiving bin generally beneath said wheel adapted toreceive unaccepted components which slide into said bin under theinfluence of gravity.

10. The apparatus of claim 9 including adjustable insert means in saidslots adapted to vary the size of the slots to accommodate various sizedcircuits.

11. The apparatus of claim 10 in which two contact elements in thecontact arm engage each lead in the circuits being tested.

1. An integrated circuit handling and testing machine comprising incombination: a wheel having a plurality of integrated circuit acceptingslots in the periphery thereof in which at least the portions of thewheel adjacent one side of the slots comprise insulating material, saidwheel being disposed for rotation in a substantially vertical plane;feed means positioned generally above said wheel adapted to gravity feedsaid circuits into said slots; receiving means positioned generallybeside and below said wheel; testing means adapted to connect testcircuitry to the leads from said circuits, said testing means comprisingcontact arms which contact the leads of the circuits by pressing theleads against the insulating material with contact elements in saidcontact arms while the circuits are in said slots; selector meansoperable to eject integrated circuits from said slots into one of saidreceiving means beside the wheel upon receiving an appropriate signalfrom said testing means; and means for periodically rotating said wheel.2. The apparatus of claim 1 in which said testing means furthercomprises electronic test circuitry connected to the contact elements insaid contact arms, which test circuitry is operable to determine thecondition of said integrated circuit and connected to the selector meansso as to control which receiving means said selector ejects the circuitinto.
 3. The apparatus of claim 2, in which said selector meanscomprises at least one spring driven member restrained by a first camfollowing means the rotation of the corresponding first cam allowing thespring driven member to periodically slide said circuits from said slotsinto one of said receiving means.
 4. The apparatus of claim 3, whereinsaid contact arms are positioned on each side of said wheel and pivotedinto contact with the leads of the circuits by the action of a secondcam following means, the rotation of the corresponding second camoperating to periodically pivot said contact arms in coordination withsaid periodic rotation of the said wheel.
 5. The apparatus of claim 4wherein said first and second cams are carried by a cam drive shaftwhich shaft is connected to a motor by means of electrically activatedclutch means and wherein said means for periodically rotating the wheelcomprises a geneva movement between said wheel and said cam drive shaft.6. The apparatus of claim 5 in which said test circuitry controls saidspring driven member by activating a blocking pin which pin, uponactivation, is retracted so as not to restrain movement of said springdriven member.
 7. The apparatus of claim 6 including a disk on said camdrive shaft, a pair of light sources adapted to shine through said disk,and a pair of light detectors adapted to receive light when passed bythe disc, said detectors connected to said test circuitry, said dischaving a pattern of light transmitting portions arranged to pass lightto said detectors and thereby signal to the teSt circuitry the positionof said cam drive shaft and therefore the appropriate times at which tobegin and end the test and activate the selector means.
 8. The apparatusof claim 7 including guide members adjacent the periphery of said wheelso as to prevent said circuits from leaving said slots at locationsother than those corresponding to said feed means and said receivingmeans.
 9. The apparatus of claim 8 in which said receiving meanscomprises an accept and a reject portion said accept portion receivingcircuits slid from said slots by said spring driven member and saidreject portion comprising a receiving bin generally beneath said wheeladapted to receive unaccepted components which slide into said bin underthe influence of gravity.
 10. The apparatus of claim 9 includingadjustable insert means in said slots adapted to vary the size of theslots to accommodate various sized circuits.
 11. The apparatus of claim10 in which two contact elements in the contact arm engage each lead inthe circuits being tested.